PLB-55i Silicon Block Scanner

This is a fast, non-contact, easy-to-use system to detect defects in silicon blocks for photovoltaic application.

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Provider:
Semilab

Types of detectable defects:

  • Crack
  • Void
  • Inclusion
  • Growth band

Features and System specifications:

  • Cut position is determined with 0.1 mm accuracy
  • Integrated motor driven rotary stage for all 4 side measurement
  • All 4 sides are measured automatically
  • Automatic evaluation software
  • Ingot type: Polished, non-polished
  • Max. ingot size: 500×210×210 mm
  • Operation: Automatic or manual
  • Real time spot detection: Included
  • 3D Visualization: Included
  • Automatic evaluation: Included
  • Automatic software evaluation with block images

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