Rigaku SmartLab Diffractometer

The Rigaku SmartLab is a versatile high resolution diffractometer working in focusing and parallel beam geometry. Fast data collection is enabled by high flux Cu X-ray intensity via its 9 kW rotating anode. The system offers high-resolution data via a Johansson Ge Kα1 monochromator. With the elimination of Kα2 radiation overlapped diffraction peaks can easily be decomposed, thus this unit is recommended for indexing or ab-initio structure analysis. Besides standard powders diffraction, the diffractometer offers X-ray reflectivity measurements for thin film thickness, roughness and density determination; full pole figures and φ-scans for crystallographic texture analysis; stress measurements; grazing incident diffraction for polycrystalline thin film and high-resolution rocking curves for film quality assessment.