454
Items
40
Providers
19
Сountries
Characterization Facilities
Showing all 29 results
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Rigaku SmartLab Diffractometer
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Zetasizer ZS90 and zetapotential granulometer
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MTS 880 Servohydraulic Test System
Provider:: AGH University of Science and Technology -
HP Agilent 4294A Impedance Analyzer
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Thermal Analysis – SETSYS Evolution 16
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PalmSens4 – Potentiostat, Galvanostat & Impedance Analyzer
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HORIBA XploRA – Raman Microscope
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AURIGA Compact – SEM / FIB – CrossBeam System
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Scanning Probe Microscope – VLS-80, NanoScan
Provider:: University of York -
ZEISS EVO MA 15 – Environmental Scanning Electron Microscope
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JEOL JEM-2100F – UHR Transmission Electron Microscope
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Scanning Electron Microscope SEM FEI QUANTA 250
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Philips X’Pert Pro Diffractometer
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Empyrean PANalytical X-Ray Diffractometer
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DX-320 Coercive Force Meter
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Inductively Coupled Plasma–Optical Emission Spectrometry (ICP-OES)
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Spectroscopic Ellipsometer – UVISEL, HORIBA
Provider:: Angers University -
Nano Indenter G200 Agilent Technologies
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Sensofar PLu neox – Optical 3D Profiler
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SEM Jeol JSM 7000F
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MTS 810 Material Testing System
Provider:: University of Patras -
JES-FA100 Electron Spin Resonance Spectrometer
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High-Temperature Lab: Five Different Independent Rigs (Lenton, Carbolite)
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Veeco Dimension Icon Atomic Force Microscope
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Instron 9250HV Impact Test Machine
Provider:: University of Patras -
Mössbauer Spectrometer
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Planetary Ball Mill – Retsch PM100
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CETR-UMT-2MT Tribological Tester
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Cryogenic Tribometer