AJA Four-Point Probe Measurement Services

AJA provides four-point probe measurement services for electrical characterization of non-insulating thin films.

The instrument can measure sheet resistance and conductivity on samples up to 6 inches. The software corrects for sample geometry, and both soft-tipped and sharp-tipped probes are available depending on the sample type and measurement requirements.

This service is suitable for conductive coatings, metallic films, semiconductor layers, transparent conductive films, and other non-insulating thin film materials where electrical performance needs to be evaluated.