AJA Ellipsometry Measurement Services – Film Sense FS-1

AJA provides ellipsometry measurement services using a Film Sense FS-1 four-color ellipsometer. This service is suitable for researchers and companies requiring fast, non-destructive characterization of dielectric thin films.

The ellipsometer can measure samples on substrates up to 8 inches and provides information on film thickness, optical constants, and film thickness uniformity across the substrate. This service can be useful for thin film process optimization, coating validation, quality control, and comparison between deposition runs.