UHR-TEM JEOL JEM-2100F Specifications:
- Point resolution of 0.19 nm
- Lens with a spherical defect coefficient of 0.5 mm
- Schottky type FEG cathode
- STEM light field detector
- STEM dark field detector / HAADF mode
- EDS detector Oxford instruments X-MAX 80 mm2
- Gatan Orius SC1000A Digital Camera
- Tilt bracket +/- 60º JEOL
- Electromagnetic shielding ETS-LINDGREN EMFC-MK IV.
Sample preparation facilities:
- Ion Slicer JEOL: Instrument dedicated to final thinning of specimen by means of accelerated ion beam (preparation of thin foils from bulk specimen & transparent areas on cross-sectioned samples);
- Fischione 1020 plasma cleaner for TEM specimen rods and samples prior to imaging;
- Dual Sputtering and Evaporation System Quorum Q150R ES;
- Automatic electrolytic thinner Struers Tenupol 5;
- Disc Grinder M623 Gatan;
- Ultrasonic Cutter M601 Gatan;
- Dimple Grinder M656 Gatan;
- Disc Punch M659 Gatan.
Location: Scanning-Transmission Electron Microscopy and Sample Preparation Laboratory
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