Institute of Materials Research - Slovak Academy of Sciences
Showing 1–10 of 16 results
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Philips X’Pert Pro Diffractometer
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JEOL JEM-2100F – UHR Transmission Electron Microscope
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ZEISS EVO MA 15 – Environmental Scanning Electron Microscope
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HORIBA XploRA – Raman Microscope
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Nano Indenter G200 Agilent Technologies
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TruLaser Station 3003 with TruFiber 400 Laser Source
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DX-320 Coercive Force Meter
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AURIGA Compact – SEM / FIB – CrossBeam System
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Sensofar PLu neox – Optical 3D Profiler
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Nanospider
