Surface topography measurements

Surface topography measurements are key in materials research, where surface quality has a significant impact on the performance of the entire product. Thanks to modern measuring devices, we are able to obtain an image of the surface with incredible accuracy, identifying any imperfections, micro-irregularities and other surface features that can affect the performance of the product.

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Thanks to advanced measurement technologies, we are able to determine roughness, texture and other surface parameters that have a key impact on the mechanical, chemical and optical properties of materials:

• non-contact measurement of height dierences, roughness and
surface mapping,
• variety of materials: metals, plastics, ceramics (except glass) can
be measured,
• our lab operates on Filmetrics’ Profilm3D.

Profilometer specification:
• Thickness range, WLI: 50 nm – 10 mm
• Thickness range, PSI: 0 – 3 μm
• Z- axis range: 37 mm
• X-Y stage range: 100 mm by 100 mm
• Motorised stage

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