The VLS-80 is a new high vacuum scanning probe microscope developed by NanoScan in Switzerland.
Modes: atomic force microscope (AFM) & magnetic force microscope (MFM)
In-plane magnetic field: -5.5 ~ +5.5 kOe
Perpendicular magnetic field: -2.0 ~ +2.0 kOe
Stage temperature: room temperature
Department of Electronic Engineering – University of York
References:
W. Frost, M. Samiepour, A. Hirohata, Perpendicular Anisotropy Controlled by Seed and Capping Layers of Heusler-Alloy Films, IEEE Trans. Electron Devices. (2021) 1–5. doi:10.1109/TED.2021.3105490.
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