Veeco Dimension Icon Atomic Force Microscope

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer. It allows to reconstruct very precise 3D representation of topography of observed surface, and to observe mechanical, electrical and magnetic properties of materials.

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Technical specifications:

  • motorized XY-stage;
  • samples max 120 mm radius;
  • max scan size 100×100 μm;
  • low noise, insulated hood;
  • video: 508-4010x;
  • tube scanner – movement in 3 directions.

Modes of operation:

  • contact mode (also in fluids);
  • tapping mode (amplitude, phase imaging);
  • lateral force microscopy (LFM);
  • friction force;
  • force modulation;
  • magnetic FM;
  • electric FM, surface potential detection;
  • dynamic modulation;
  • nanoindentation;
  • piezoresponse;
  • scanning tunneling microscopy;
  • peak force QNM – quantitative nanomechanical;
  • mapping of material properties.

Location: Laboratory of Atomic Force Microscopy at the Structural Ceramics Department

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