SEM Jeol JSM 7000F

Multifunctional high-resolution scanning electron microscope (SEM) JEOL JSM-7000F with auto-emission gun “THERMAL FEG”. It serves for detailed (submicron) microstructural analyses of materials up to 100,000-times magnification. Apart from morphological observations of microstructural objects, in combination with units EDX, EBSD Oxford Instruments, it enables to obtain information about their chemical composition, phase composition and crystallographic orientation.

• Resolution: 1.0 nm (15 kV), 1.4 nm (1 kV)
• Magnification: from x25 to x1,000,000
• Voltage: from 0.1 kV to 30 kV
• Energy-Dispersive X-Ray Spectroscopy (EDS or EDX)
• Electron Backscatter Diffraction (EBSD)