Institute of Materials Research - Slovak Academy of Sciences

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  ZEISS EVO MA 15 – Environmental Scanning Electron Microscope

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  DX-320 Coercive Force Meter

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  Philips X’Pert Pro Diffractometer

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  SEM Jeol JSM 7000F

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  Sensofar PLu neox – Optical 3D Profiler

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  HP Agilent 4294A Impedance Analyzer