Institute of Materials Research - Slovak Academy of Sciences
Showing 1–10 of 11 results
-
SEM Jeol JSM 7000F
-
ZEISS EVO MA 15 – Environmental Scanning Electron Microscope
-
HP Agilent 4294A Impedance Analyzer
-
JEOL JEM-2100F – UHR Transmission Electron Microscope
-
AURIGA Compact – SEM / FIB – CrossBeam System
-
DX-320 Coercive Force Meter
-
HORIBA XploRA – Raman Microscope
-
Philips X’Pert Pro Diffractometer
-
Sensofar PLu neox – Optical 3D Profiler
-
Nano Indenter G200 Agilent Technologies
