Equipment:
- ceramic X-ray tube (anode materials: Cu, Co, Mo);
- detectors: PIXcel3D & proportional detector;
- high-temperature chamber Anton Paar HTK 16N for in-situ diffraction studies in high temperatures up to 1600ºC;
- high-temperature chamber Anton Paar HTK 2000N with temperature range of 25–2300°C.
Four kinds of sample stages:
- stationary sample stage for measuring flat samples;
- reflection-transmission spinner with the option of rotating the samples (powders and solid objects);
- 3-axis (Chi-Phi-Z) cradle for measuring residual stress and sample texture;
- 5-axis (Chi-Phi-XYZ) cradle for measuring reflectivity, residual stress and sample texture.
Software:
- HighScore Plus;
- Stress Plus;
- Texture;
- PDF-4+ (ICDD) – diffraction database.
Location: Centre of Materials Research at Łukasiewicz Research Network – Krakow Institute of Technology.
See CV of the responsible person.
See address of the Centre of Materials Research at LRN-KIT
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