Sensofar PLu neox – Optical 3D Profiler

A unique dual system for precise measurement of surface topography with two different optical methods – confocal microscopy and optical interferometry in two modes (phase shift interference – PSI and vertical scanning interference – VSI). At present there are only two manufacturers of such dual systems – Sensofar and Leica, both utilizing a patent by Sensofar.

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  • Dual illumination by white and short wave monochromatic light;
  • Automatic switching between the confocal and interferometric modes just by choosing the objective and switching the software;
  • Vertical resolution in the PSI mode < 0.02 nm;
  • Deviation from linearity during the vertical scanning in 50 um range < 60 nm;
  • Vertical resolution in the VSI mode < 1.5 nm Frame rate in the confocal mode > 10 frame/s;
  • Interferometric objectives from x2.5 up to x150;
  • Optical surface imaging in bright field in real colours;
  • Motorized and piezo movement in Z direction, motorized XY table;
  • Manual biaxial slope correction;
  • Software for mapping and stitching of images, and evaluation of topographic surface parameters.

Location: Laboratory of Light Microscopy

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