Scanning Electron Microscope SEM FEI QUANTA 250

High resolution, fully digitized, produced by FEI Company, incorporated with Energy Dispersive X-Ray Spectrometer, produced by EDAX, consisting of ELEMENT Silicon Drift Detector Fixed, Element EDS Analysis Software Suite. The Quanta 250 system, purchased in 2017, is designed to study conductive, non-conductive and/or hydrated samples in their natural state, without additional preparation (metallization).
Department: IMNR – Analysis Laboratory

References:
A.M. Motoc, S. Valsan, A.E. Slobozeanu, M. Corban, D. Valerini, M. Prakasam, M. Botan, V. Dragut, B. St. Vasile, A.V. Surdu, R. Trusca, M.L. Grilli, R.R. Piticescu, Design, Fabrication, and Characterization of New Materials Based on Zirconia Doped with Mixed Rare Earth Oxides: Review and First Experimental Results, Metals (Basel). 10 (2020) 746. doi:10.3390/met10060746.