Institute of Materials Research - Slovak Academy of Sciences
Showing 1–10 of 11 results
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Sensofar PLu neox – Optical 3D Profiler
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DX-320 Coercive Force Meter
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HORIBA XploRA – Raman Microscope
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Veeco Dimension Icon Atomic Force Microscope
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Philips X’Pert Pro Diffractometer
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HP Agilent 4294A Impedance Analyzer
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Nano Indenter G200 Agilent Technologies
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AURIGA Compact – SEM / FIB – CrossBeam System
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ZEISS EVO MA 15 – Environmental Scanning Electron Microscope
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SEM Jeol JSM 7000F